Next Generation Memory

Memory subsystems and platforms for the next generation

Next Generation Memory

Overview

As AI and other data-intensive applications continue to demand higher bandwidth and larger memory capacity, conventional memory systems face increasing challenges in performance, scalability, and energy efficiency. We investigate next-generation memory systems and architectures that efficiently integrate emerging memory technologies into modern computing platforms. Our research includes advanced memory subsystems, heterogeneous and composable memory architectures, memory management techniques, and system-level platforms for improving the performance and efficiency of future memory systems.

Selected Publications

Top Tier DAC
Ji Hun Choi, Jae Sang Moh and Tae Hee Han
2026 63rd ACM/IEEE Design Automation Conference (DAC), Jul. 26, 2026
#Memory System #GPU #Address Translation Abstract
IEEE Access
Chang Ho Ryu and Tae Hee Han
IEEE Access, Vol. 13, pp. 115048-115062, Jul. 02, 2025
#Memory System #AI Accel #Prefetching #ML-Based Abstract
ICEIC
Hyeong Jin Kim,Woo Hyun Kim,Tae Hee Han
2025 International Conference on Electronics, Information, and Communication (ICEIC), Jan. 19, 2025
#Memory System #Address Translation #TLB Abstract
Featured Article IEEE Access
Ho Jung Yoo, Jeong Hun Kim and Tae Hee Han
IEEE Access, Vol. 11, pp. 145238-145253, Dec. 2023
#Memory System #AI Accel #Cache #ML-Based Abstract
IEEE Access
Jae Eun Shim, Min Gu Kang, and Tae Hee Han
IEEE Access, Vol. 11, pp. 3080-3095, Jan. 2023
#Memory System #NoC #Cache Coherence #Directory Abstract
Electronics
Hyun Jo Lim, Dong Kun Shin, and Tae Hee Han
Electronics, Vol. 11, No. 23, Dec. 2022
#Memory System #SSD #Storage Abstract
Electronics
Sungchul Yoon, Sungho Jun, Yongkwon Cho, Kilhwan Lee, Hyukjae Jang, and Tae Hee Han
Electronics, Vol. 9, No. 5, May 2020.
#Memory System #SoC Design #Compression #Mobile SoC Abstract
Electronics
Jeong Beom Hong, Young Sik Lee, Yong Wook Kim, and Tae Hee Han
Electronics, Vol. 9, No. 4, Apr. 2020.
#Memory System #PCM #Reliability Abstract